Nicollian & Brews dedicated entire chapters to imperfections. The interface is atomically abrupt but contains defects—dangling bonds, strained Si–O–Si bonds, and impurity atoms—leading to:
Where m is an empirical exponent (≈3 for electrons). Accelerated life tests stress devices at elevated V_d and V_g, monitoring parameters like linear drain current (I_dlin) or transconductance (g_m). A 10% degradation is a common failure criterion. Nicollian & Brews dedicated entire chapters to imperfections